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10.3: An Empirical Analysis of Effect Factors for High Reliability on AMOLED Display
Author(s) -
Kim Hojoong,
Jung Chanhyuk,
Kwon JangYeon,
Kim Songkuk
Publication year - 2015
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10305
Subject(s) - amoled , luminance , reliability (semiconductor) , materials science , oled , degradation (telecommunications) , stability (learning theory) , computer science , optoelectronics , thin film transistor , artificial intelligence , active matrix , composite material , telecommunications , physics , power (physics) , layer (electronics) , quantum mechanics , machine learning
A luminance degradation of AMOLED display is analyzed in order to figure out driving factors for high performance of reliability on a large‐scaled display. The initial non‐uniformity and ageing parameters were incorporated into the luminance decay model. For each set of parameters, we simulated the luminance degradation of 10,000 panels for 100,000 operating hours and analyzed by two criteria; contrast deviation and luminance variation of panels to determine failures. Stability of TFTs is the most significant parameter for realizing highly reliable AMOLED display. Stability of OLEDs is also potential factor when which of TFTs is sufficient.