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42.2: Stress Induced Substrate Mura in Curved LCD
Author(s) -
Hemanth Vepakomma K.,
Ishikawa Tomohiro,
Greene Raymond G.
Publication year - 2015
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10230
Subject(s) - birefringence , substrate (aquarium) , mura , materials science , enhanced data rates for gsm evolution , stress (linguistics) , square (algebra) , optics , composite material , liquid crystal display , optoelectronics , geometry , physics , engineering , mathematics , telecommunications , geology , linguistics , oceanography , philosophy
Curving flat substrates creates retardance proportional to the square of the thickness, approximately three times the typical max value of flat substrates. These stress patterns have distinctive interactions with dark state VA and IPS LC modes. Curved substrate stress‐birefringence can create unique circular polarized edge mura through liquid crystal and substrate interactions.