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52.2 Non‐Destructive Analyses of Operational Degradation of OLED Devices
Author(s) -
Miyamae Takayuki,
Takada Noriyuki,
Yoshioka Toshihiro,
Miyaguchi Satoshi,
Ohata Hiroshi,
Okumoto Hajime,
Yahiro Masayuki,
Tsutsui Yuko,
Adachi Chihaya,
Tsutsui Tetsuo
Publication year - 2015
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10226
Subject(s) - oled , degradation (telecommunications) , dielectric spectroscopy , materials science , spectroscopy , diode , optoelectronics , chemistry , nanotechnology , computer science , telecommunications , physics , layer (electronics) , electrode , quantum mechanics , electrochemistry
Non‐destructive analyses are conducted on the intrinsic degradation of organic light‐emitting diodes (OLEDs). After longterm operation, sum‐frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.