Premium
P‐129: Comprehensive Analysis of Luminous Decay Curves for Accelerated Lifetime Testing of OLEDs
Author(s) -
Yoshioka Toshihiro,
Sugimoto Kazunori,
Ohata Hiroshi,
Miyaguchi Satoshi,
Tsutsui Tetsuo
Publication year - 2015
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10149
Subject(s) - exponential function , oled , exponential decay , degradation (telecommunications) , luminous flux , function (biology) , exponential growth , light curve , luminous efficacy , physics , materials science , computational physics , astrophysics , mathematics , optics , computer science , nuclear physics , mathematical analysis , nanotechnology , quantum mechanics , telecommunications , biology , light source , layer (electronics) , evolutionary biology
We analyzed luminous degradation curves with the stretched‐exponential decay function to develop a lifetime prediction method. By using the proposed method, we succeeded in evaluating the lifetimes of several OLEDs on the basis of limited data sets obtained in a short test time.