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P‐68: An Efficient Simulation Algorithm for Analysis of Moiré Patterns in Display Systems
Author(s) -
Lee TaekSung,
Kim Won Mok,
Byun SeokJoo,
Lee Jangkyo,
Byun Seok Yong
Publication year - 2015
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/sdtp.10135
Subject(s) - superposition principle , computation , moiré pattern , convolution (computer science) , algorithm , ray tracing (physics) , computer science , surface (topology) , reflection (computer programming) , optics , scale (ratio) , point (geometry) , mathematics , physics , computer vision , artificial intelligence , geometry , mathematical analysis , quantum mechanics , artificial neural network , programming language
In this paper, we propose a precise and fast computational method for the simulation and analysis of moire patterns including a complex, large scale of films and a reflecting surface under illumination of an external ambient light source. This algorithm is based on convolution with superposition of the intensity profile which is transmitted from the optical layers and the point spread function. The computation time is shown to be much faster than that of the conventional ray‐tracing algorithm. It was also considered of an optically equivalent system with no reflection surface layer in order to handle a non‐sequential system containing a reflecting surface.