Open AccessFocused ion beam manipulation and ultramicroscopy of unprepared cells
Author(s) -
Milani Marziale,
Drobne Damjana
Publication year - 2006
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950280303
Subject(s) - focused ion beam , scanning electron microscope , materials science , nanoscopic scale , nanotechnology , ion beam , ion , ultrastructure , electron microscope , optics , composite material , chemistry , biology , anatomy , physics , organic chemistry
The focused ion beam (FIB) technique of nanomachining combined with simultaneous scanning electron microscopy (SEM) was used for submicron manipulation and imaging of unprepared (fresh) cells to demonstrate the potentiality of the FIB/SEM technique for ultramicroscopic studies. Sectioning at the nanoscale level was successfully performed by means of ion beam‐driven milling operations that reveal the ultrastructure of fresh yeast cells. The FIB/SEM has many advantages over other ultramicroscopy techniques already applied for unprepared/fresh biological samples.