Scanning the industry: Seeing at Atomic Resolution is Believing: Welcome the Helium Ion Microscope
Publication year - 2005
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950270609
Subject(s) - resolution (logic) , citation , computer science , library science , nanotechnology , materials science , artificial intelligence
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