Open AccessX‐modulation: Instrumentation and optimization
Author(s) -
Moon SeungHo,
Foster Mark D.
Publication year - 2005
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950270108
Subject(s) - instrumentation (computer programming) , sort , modulation (music) , flexibility (engineering) , computer science , sample (material) , automation , electronic engineering , acoustics , mechanical engineering , engineering , physics , mathematics , statistics , thermodynamics , information retrieval , operating system
The measurement of lateral force in response to small amplitude lateral oscillations of a sample using a scanning probe microscope (X‐modulation) is presented as an effective means of identifying key qualitative differences in the nanomechanical behavior of solid surfaces. To study the surface behavior in detail, it is critical that the instrument have sufficient flexibility. Computer‐assisted measurement automation achieved using LabVIEW TM makes an X‐modulation experiment more flexible and convenient. Even though further refinement of the modulation technique is necessary in both theory and experiment to obtain a complete picture, the systematic approach made possible by this sort of instrumentation is valuable for the study of mechanical properties of the surface.