Open AccessCrystallographic orientation assessment by electron backscattered diffraction
Author(s) -
Cléton F.,
Jouneau P. H.,
Henry S.,
Gäumann M.,
Buffat P. A.
Publication year - 1999
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950210402
Subject(s) - electron backscatter diffraction , orientation (vector space) , materials science , superalloy , diffraction , laser , microstructure , optics , crystallography , pole figure , geometry , metallurgy , physics , mathematics , chemistry
With an angular orientation accuracy of at least 1°, the ability of electron backscattered diffraction (EBSD) to determine and emphasise crystallographic orientation is illustrated. Using the abilities of specially developed software for computing Euler angles derived from the scanned specimen, misorientations are pointed out with acceptable flexibility and graphic output through crystallographic orientation maps or pole figures. This ability is displayed in the particular case of laser cladding of nickel‐based superalloy, a process that combines the advantages of a near net‐shape manufacturing and a close control of the solidification microstructure (E‐LMF: epitaxial laser metal forming).