
Numerical chromosomal abnormalities detected by atomic force microscopy
Author(s) -
Ergün Mehmet Ali,
Tan Erdal,
Şahin Feride Iffet,
Menevşe Adnan
Publication year - 1999
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950210302
Subject(s) - metaphase , trisomy , atomic force microscopy , microscopy , resolution (logic) , optical microscope , karyotype , optics , chromosome , materials science , biology , physics , genetics , nanotechnology , computer science , artificial intelligence , scanning electron microscope , gene
The numerical abnormalities of human metaphase chromosomes, fixed according to standard procedures for optical microscopy but not treated for banding, were detected by atomic force microscopy (AFM). High‐resolution AFM imaging of chromosomes in trisomy 13, 21, and Klinefelter syndrome can be compared directly with the traditional optical image. The unbanded metaphase chromosomes, including the extra ones in trisomic patients showed a structural pattern very similar to G‐banding. Comparison of AFM images with light microscopic data allows the identification of specific chromosomes, and images of chromosomes showing numerical and structural abnormalities can then be analysed.