Open AccessSurface plasmon and guided optical wave microscopies
Author(s) -
Aust E. F.,
Sawodny M.,
Ito S.,
Knoll W.
Publication year - 1994
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950160606
Subject(s) - evanescent wave , characterization (materials science) , plasmon , surface plasmon resonance , materials science , surface plasmon , optics , resolution (logic) , optical phenomena , light wave , optical imaging , field (mathematics) , optoelectronics , localized surface plasmon , nanotechnology , physics , computer science , nanoparticle , mathematics , artificial intelligence , pure mathematics
This article summarizes some recent developments in the field of surface plasmon and guided optical wave microscopies. It is shown that these imaging techniques based on evanescent light allow for a quantitative optical characterization of ultrathin films with a thickness sensitivity of a few Ångstroms and a lateral resolution of μm.