Open AccessEvanescent‐field scanning microscope with fourier‐transform infrared spectrometer
Author(s) -
Nakano T.,
Kawata S.
Publication year - 1994
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950160314
Subject(s) - microscope , optics , spectrometer , prism , scanning hall probe microscope , resolution (logic) , materials science , fourier transform infrared spectroscopy , infrared , near field scanning optical microscope , fourier transform , wavelength , optical microscope , refractive index , microscopy , fourier transform spectroscopy , microanalysis , scanning electron microscope , chemistry , conventional transmission electron microscope , physics , scanning transmission electron microscopy , quantum mechanics , artificial intelligence , organic chemistry , computer science
An evanescent‐field scanning microscope for infrared microanalysis has been developed. This microscope uses an evanescent field produced by total internal reflection with a high refractive index prism to attain a high spatial resolution, better than the wavelength. This microscope was combined with a Fourier‐transform spectrometer. The principle of the method and experimental results for edge detection at different absorption wavelengths are described.