Open AccessDetectability: A new criterion for evaluation of the confocal microscope
Author(s) -
Gan X. S.,
Sheppard C. J. R.
Publication year - 1993
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950150402
Subject(s) - confocal , microscope , transverse plane , optics , confocal microscopy , computer science , physics , computer vision , artificial intelligence , materials science , biology , anatomy
We introduce a new criterion to explore the performance, with respect to signal‐noise ratio for fluorescent imaging, in the confocal microscope. This criterion, which we term detectability, has three forms: transverse, axial, and three‐dimensional. It describes the ease with which a small object can be detected in transverse images, axial images, and three‐dimensional images.