Open AccessObservations of Hg 0.7 Cd 0.3 Te epilayers by infrared cathodoluminescence detection
Author(s) -
Myhajlenko S.,
Edwards J.L.,
Rowley K.L.,
Roedel R.J.
Publication year - 1990
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950120206
Subject(s) - cathodoluminescence , infrared , epitaxy , materials science , wavelength , liquid phase , radiation , liquid helium , analytical chemistry (journal) , characterization (materials science) , optoelectronics , helium , optics , chemistry , nanotechnology , physics , luminescence , atomic physics , layer (electronics) , chromatography , thermodynamics
Extension in wavelength detection of cathodoluminescence (CL) toward the infrared is an area attracting interest regarding its development potential. This article describes our progress in CL characterization of Hg 1−x Cd x Te epilayers intended for optoelectronic array applications in the 3–5 μm radiation window. We present a description of the equipment set‐up, experimental procedure, and difficulties encountered in this study. We present preliminary observations performed at liquid helium temperatures of CL contrast variations from liquid phase epitaxial layers of Hg 0.7 Cd 0.3 Te lattice matched to Cd 0.96 Zn 0.04 Te substrates.