Open AccessScanning ion‐conductance microscope and atomic force microscope
Author(s) -
Prater C. B.,
Drake B.,
Gould S. A. C.,
Hansma H. G.,
Hansma P. K.
Publication year - 1990
Publication title -
scanning
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.4950120109
Subject(s) - atomic force microscopy , library science , art history , physics , engineering physics , history , nanotechnology , materials science , computer science