Open AccessThe secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison
Author(s) -
Walker C.G.H.,
ElGomati M.M.,
Assa'd A.M.D.,
Zadražil M.
Publication year - 2008
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.20124
Subject(s) - secondary electrons , electron , atomic physics , range (aeronautics) , monte carlo method , excited state , yield (engineering) , secondary emission , cathode ray , plasmon , mean free path , intensity (physics) , materials science , physics , optics , nuclear physics , optoelectronics , statistics , mathematics , metallurgy , composite material
The secondary electron (SE) yield, δ , was measured from 24 different elements at low primary beam energy (250–5,000 eV). Surface contamination affects the intensity of δ but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30:365–380, 2008. © 2008 Wiley Periodicals, Inc.