The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison | Zendy

Walker C.G.H. | Zendy; ElGomati M.M. | Zendy; Assa'd A.M.D. | Zendy; Zadražil M. | Zendy

Open Access

The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 ev: a theory/experiment comparison

Author(s) -

Walker C.G.H.,

ElGomati M.M.,

Assa'd A.M.D.,

Zadražil M.

Publication year - 2008

Publication title -

scanning

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.359

H-Index - 47

eISSN - 1932-8745

pISSN - 0161-0457

DOI - 10.1002/sca.20124

Subject(s) - secondary electrons , electron , atomic physics , range (aeronautics) , monte carlo method , excited state , yield (engineering) , secondary emission , cathode ray , plasmon , mean free path , intensity (physics) , materials science , physics , optics , nuclear physics , optoelectronics , statistics , mathematics , metallurgy , composite material

The secondary electron (SE) yield, δ , was measured from 24 different elements at low primary beam energy (250–5,000 eV). Surface contamination affects the intensity of δ but not its variation with primary electron energy. The experiments suggest that the mean free path of SEs varies across the d bands of transition metals in agreement with theory. Monte Carlo simulations suggest that surface plasmons may need to be included for improved agreement with experiment. SCANNING 30:365–380, 2008. © 2008 Wiley Periodicals, Inc.

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