Open AccessImage sharpness measurement in scanning electron microscopy—part II
Author(s) -
Vladár Andrá E.,
Postek Michael T.,
Davidson Mark. P.
Publication year - 1998
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.1998.4950200104
Subject(s) - magnification , scanning electron microscope , sample (material) , optics , signal (programming language) , cathode ray , beam (structure) , image (mathematics) , electron , materials science , computer science , artificial intelligence , physics , quantum mechanics , thermodynamics , programming language
Abstract A method for qualitative and quantitative analysis of scanning electron microscope (SEM) images forthe determination of sharpness is presented in this paper. Described is a procedure for qualitative analysis based on a software program called SEM Monitor that can be applied to research or industrial SEMs for day‐to‐day performance monitoring. The idea is based on the fact that, as the electron beam scans the sample, the low‐frequency changes in the video signal show information about the larger features and the high‐frequency changes give data on finer details. The image contains information about the primary electron beam and about all the parts contributing to the signal formation in the SEM. If everything else is kept unchanged, with a suitable sample, the geometric parameters of the primary electron beam can be mathematically determined. An image of a sample, which has fine details at a given magnification, is sharper if there are more high frequency changes in it. In the SEM, a better focused electron beam yields a sharper image, and this sharpness can be measured. The method described is based on calculations in the frequency domain and can also be used to check and optimize two basic parameters of the primary electron beam, the focus, and the astigmatism.