Open AccessOptimizing AC‐mode atomic force microscope imaging
Author(s) -
Ho Huddee,
West Paul
Publication year - 1996
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1002/sca.1996.4950180503
Subject(s) - scanning electron microscope , cantilever , scanning probe microscopy , non contact atomic force microscopy , materials science , resolution (logic) , oscillation (cell signaling) , microscope , optics , image resolution , image quality , amplitude , scanning ion conductance microscopy , atomic force microscopy , kelvin probe force microscope , chemistry , nanotechnology , image (mathematics) , physics , composite material , scanning confocal electron microscopy , biochemistry , artificial intelligence , computer science
Abstract We have operated an atomic force microscope in ambient air with several oscillating cantilever modes to establish the optimal scanning parameters to maximize image resolution and to minimize probe and sample damage. This was done by scanning a surface in air and correlating scan parameters such as oscillation amplitude and damping with image resolution. We also examined the geometry of the probe with a scanning electron microscope, before and after scanning, in order to determine whether the scanning technique had an effect on the geometry of the probe tip. If the probe is oscillated such that it contacts the surface on each oscillation, substantial damage or “wear” to the probe occurs and significant degradation of image quality was observed. In ambient air, the optimal conditions are achieved when the probe penetrates the contamination layer and reverses direction before touching the surface. Under these “near‐contact” conditions no probe damage is observed and high‐image resolution can be maintained indefinitely.