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Robust identification/invalidation in an LPV framework
Author(s) -
Bianchi Fernando D.,
SánchezPeña Ricardo S.
Publication year - 2010
Publication title -
international journal of robust and nonlinear control
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.361
H-Index - 106
eISSN - 1099-1239
pISSN - 1049-8923
DOI - 10.1002/rnc.1430
Subject(s) - identification (biology) , computation , dependency (uml) , set (abstract data type) , complement (music) , noise (video) , computer science , nonlinear system , control theory (sociology) , consistency (knowledge bases) , state space , robust control , controller (irrigation) , identification scheme , robustness (evolution) , system identification , algorithm , mathematics , control (management) , data modeling , data mining , artificial intelligence , image (mathematics) , chemistry , statistics , botany , database , biology , biochemistry , programming language , measure (data warehouse) , physics , complementation , gene , phenotype , quantum mechanics , agronomy
A robust linear parameter varying (LPV) identification/invalidation method is presented. Starting from a given initial model, the proposed method modifies it and produces an LPV model consistent with the assumed uncertainty/noise bounds and the experimental information. This procedure may complement existing nominal LPV identification algorithms, by adding the uncertainty and noise bounds which produces a set of models consistent with the experimental evidence. Unlike standard invalidation results, the proposed method allows the computation of the necessary changes to the initial model in order to place it within the consistency set. Similar to previous LPV identification procedures, the initial parameter dependency is fixed in advance, but here a methodology to modify this dependency is presented. In addition, all calculations are made on state‐space matrices which simplifies further controller design computations. The application of the proposed method to the identification of nonlinear systems is also discussed. Copyright © 2009 John Wiley & Sons, Ltd.