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Two‐color symmetry breaking in laser‐based secondary neutral mass spectrometry
Author(s) -
Jerigova Monika,
Lorenc Dusan,
Velic Dusan
Publication year - 2020
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.8828
Subject(s) - chemistry , mass spectrometry , ion , analytical chemistry (journal) , ionization , fragmentation (computing) , mass spectrum , yield (engineering) , laser , silver nanoparticle , atomic physics , nanoparticle , optics , nanotechnology , chromatography , materials science , physics , organic chemistry , computer science , metallurgy , operating system
Rationale An alternative method of analysis for laser‐based secondary neutral mass spectrometry is introduced. Methods By mixing a fundamental 1240 nm wavelength of the near‐infrared laser field with an intensity of 1 × 10 15 W/cm 2 with its second harmonic generation wavelength of 620 nm, control is attained over the ion yield in secondary neutral mass spectrometry for a native silver surface and a surface covered with silver nanoparticles. Results The ion yields of selected species in the mass spectra, such as a C 2 H 4 O 2 surfactant fragment ion and the Ag ion, are enhanced or suppressed by a factor of 8 or 23, respectively, in comparison with single color post‐ionization. In addition, a significant suppression of ion fragmentation is demonstrated for both the silver sample and silver nanoparticles. Periodic variation of the ion yield with a modulation depth of 4% is observed depending upon the relative phase between the fundamental and second harmonic generated fields. These variations are explained in terms of tunneling ionization with symmetry‐broken fields. Conclusions An additional degree of freedom in a form of additional second color is introduced in laser‐based secondary neutral mass spectrometry. Ion yield control is extended in a form of symmetry‐broken fields.