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An investigation of the beam damage effect on in situ liquid secondary ion mass spectrometry analysis
Author(s) -
Yu Xiaofei,
Yu Jiachao,
Zhou Yufan,
Zhang Yanyan,
Wang Jungang,
Evans James E.,
Yu XiaoYing,
Wang XueLin,
Zhu Zihua
Publication year - 2017
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.7983
Subject(s) - chemistry , secondary ion mass spectrometry , ion , analytical chemistry (journal) , static secondary ion mass spectrometry , ion beam , mass spectrometry , fragmentation (computing) , polyatomic ion , in situ , ion beam deposition , ion source , chromatography , organic chemistry , computer science , operating system
Rationale During in situ liquid secondary ion mass spectrometry (SIMS) analysis, the primary ion beam is normally scanned on a very small area to collect signals with high ion doses (10 14 to 10 16 ions/cm 2 ). As a result, beam damage may become a concern when compared with the static limit of SIMS analysis, in which the dose is normally less than 10 12 ions/cm 2 . Therefore, a comparison of ion yields in in situ liquid SIMS analysis versus traditional static SIMS analysis of corresponding dry samples is of great interest. Methods In this study, a dipalmitoylphosphatidylcholine (DPPC) liposome solution was used as a model system. Both liquid sample and dry sample were examined. Secondary ion yields using three primary ion species (Bi + , Bi 3 + and Bi 3 ++ ) with various beam currents were investigated. Results Usable ion yields for both positive and negative characteristic signals (including molecular ions and characteristic fragment ions) were achievable based on optimized experimental conditions for in situ liquid SIMS analysis. The ion yield of the key DPPC molecular ion was comparable to that of traditional static SIMS, and unexpected low fragmentation was observed. The flexible structure of the liquid plays an important role for these observations. Conclusions Therefore, beam damage may not be a concern in in situ liquid SIMS analysis if proper experimental conditions are used.