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Computer simulations of a new toroidal‐cylindrical ion trap mass analyzer
Author(s) -
Yu Quan,
Tang Lijuan,
Ni Kai,
Qian Xiang,
Wang Xiaohao
Publication year - 2016
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.7713
Subject(s) - ion trap , chemistry , ion , trap (plumbing) , toroid , quadrupole ion trap , mass spectrometry , atomic physics , radius , spectrum analyzer , tandem , analytical chemistry (journal) , plasma , optics , physics , nuclear physics , materials science , chromatography , computer security , organic chemistry , meteorology , computer science , composite material
Rationale A novel toroidal‐cylindrical ion trap (TCIT) design is introduced based on a compact dual ion trap system that comprises an outer toroidal ion trap (T‐trap) and an inner cylindrical ion trap (CIT). These two traps have specific but different functions that can improve the performance of tandem mass analysis operation. Methods The TCIT is studied by using a simulated mass spectrometer platform that is mainly based on SIMION modeling and extensive data processing. This platform combines different functions, such as simulation of ion motion and field calculations, as well as acquisition of a simulated mass spectrum. Results The main steps of the MS operation, including the full scan process, the mass‐selective ejection of the ions in the T‐trap, and the capture of the injected precursor ions in the CIT, are realized using the abovementioned platform. In addition, the simulated design is optimized for improved mass analysis performance. Conclusions For the outer T‐trap, when the outside surface of the inner cylindrical electrode is modified to include a circular arc with appropriate radius, the ion ejection efficiency that is directed into the CIT could be significantly enhanced. In the case of the inner CIT, the ion capture efficiency could be improved to more than 90% with geometry optimization. Copyright © 2016 John Wiley & Sons, Ltd.