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Application of sulfur as a matrix for laser desorption/ionization in the characterization of halogenated fullerenes
Author(s) -
Streletskiy Alexey V.,
Kouvitchko Igor V.,
Esipov Stanislav E.,
Boltalina Olga V.
Publication year - 2001
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.551
Subject(s) - chemistry , characterization (materials science) , fullerene , ionization , sulfur , soft laser desorption , matrix (chemical analysis) , desorption , matrix assisted laser desorption electrospray ionization , laser , mass spectrometry , analytical chemistry (journal) , organic chemistry , matrix assisted laser desorption/ionization , nanotechnology , chromatography , electron ionization , ion , adsorption , optics , materials science , physics
The application of sulfur as a matrix for matrix‐assisted laser desorption/ionization time‐of‐flight mass spectrometry (MALDI‐TOFMS) analysis of highly chlorinated and fluorinated fullerenes is reported. Control over fluorofullerene fragmentation which resulted in the domination of the molecular peak C 60 F 36 − was achieved, with the optimal matrix‐to‐analyte ratio found to be 1000:1. We suggest the possible mechanism of the molecular ion formation according to the charge transfer between the sulfur anions and C 60 F 36 . For the first time the LDI and MALDI mass spectra of the highly chlorinated fullerene C 60 Cl x (x max ≈ 32) are presented. The formation of odd chlorine ions (positive and negative) is observed. We conclude that use of sulfur as a matrix leads to a significant decrease in fragmentation of the halogenated fullerenes. Copyright © 2001 John Wiley & Sons, Ltd.
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