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Mass‐selective axial ejection from a linear ion trap with a direct current extraction field
Author(s) -
Sugiyama Masuyuki,
Hasegawa Hideki,
Hashimoto Yuichiro
Publication year - 2009
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.4204
Subject(s) - chemistry , quadrupole ion trap , lens (geology) , trap (plumbing) , ion , ion trap , atomic physics , excitation , excited state , projectile , optics , materials science , physics , metallurgy , organic chemistry , quantum mechanics , meteorology
We have developed a new mass‐selective axial ejection method from a linear ion trap (LIT). In this method, a set consisting of a trap wire lens and an extraction wire lens positioned orthogonally to each other was placed between quadrupole rods. The trap wire lens confines the ions inside the trap, and the extraction wire axially extracts ions from the trap. Ions introduced into the LIT are trapped between the inlet lens and the trap wire lens. In addition to the wire lenses, a set of excitation lenses, which are aligned orthogonally to the trap wire lens, are inserted between rods. The ions are resonantly excited in the direction perpendicular to the trap wire lens by applying a supplemental alternating current (AC) to the excitation lenses. Excited ions with a large motion pass over the trap wire lens, while unexcited ions remain trapped inside. Ions that have passed over the trap wire lens are then extracted by the extraction wire lens. The characteristics of the mass‐selective ejection with a direct current (DC) extraction field were investigated by both simulation and experiment. A mass resolving power of m/Δm = 1300 was achieved at a scan rate of 500 Th/s. The dependence of the ejection efficiency on trap wire lens bias was measured, and an ejection efficiency of 20% at a scan rate of 500 Th/s was achieved by optimizing the DC bias on the trap wire lens. Copyright © 2009 John Wiley & Sons, Ltd.