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Field distribution in an electrospray ionization source determined by finite element method
Author(s) -
Zhong Xuefei,
Yi Rong,
Holliday Alison E.,
Chen David D. Y.
Publication year - 2009
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.3914
Subject(s) - electric field , chemistry , sprayer , multiphysics , voltage , lens (geology) , mass spectrometry , ion , ion source , analytical chemistry (journal) , signal (programming language) , ionization , field (mathematics) , finite element method , atomic physics , computational physics , optics , physics , mechanical engineering , chromatography , mathematics , organic chemistry , quantum mechanics , computer science , pure mathematics , engineering , thermodynamics , programming language
Abstract Three‐dimensional computer models of electrospray ionization sources were constructed in COMSOL Multiphysics™ to solve the static electric fields using finite element methods. The magnitude of the electric field strength for onset of electrospray and optimum signal was calculated under various conditions. The modification of the electric field distribution in the ion source by an atmospheric pressure ion lens was also investigated by plotting the equipotential surfaces, electric field lines and trajectories of charged droplets. Both the calculated and the experimental results demonstrate that the changes in the ion signal detected by the mass spectrometer are attributable to the focusing effect of the ion lens when appropriate voltages are applied on the sprayer and ion lens. The optimum signal was found by setting the sprayer voltage from 3000 to 5000 V while scanning the ion lens voltage. The calculated strengths of the electric field at the sprayer tip for optimum signals are similar although the applied voltages at the sprayer and ion lens are significantly different. Copyright © 2009 John Wiley & Sons, Ltd.