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Development of a tabletop time‐of‐flight mass spectrometer with an ion attachment ionization technique
Author(s) -
Saito Naoaki,
Nanjyo Jyunichi,
Taneda Yasuyuki,
Shiokawa Yoshiro,
Tanimoto Mitsumori
Publication year - 2007
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.3139
Subject(s) - mass spectrometry , chemistry , fragmentation (computing) , time of flight , mass spectrum , ionization , electron ionization , ion , analytical chemistry (journal) , time of flight mass spectrometry , ion source , spectral line , adduct , mass , chromatography , physics , organic chemistry , astronomy , computer science , operating system
We report a new type of mass spectrometry based on a time‐of‐flight mass spectrometer combined with an ion attachment ionization technique (IA‐TOF). In contrast to electron ionization mass spectra, IA‐TOF mass spectra are not complicated by peaks due to fragmentation of the molecular ion; the adduct ion formed in IA does not fragment. We developed a tabletop IA‐TOF system and evaluated its performance by analyzing specimens originally in the gas, liquid, and solid phases. We obtained fragment‐free spectra covering a mass range up to m/z 3400 with a mass resolution of about 4700. Our IA‐TOF system realizes accurate and versatile real‐time mass spectrometry. Copyright © 2007 John Wiley & Sons, Ltd.