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A novel discharge source of hydronium ions for proton transfer reaction ionization: design, characterization, and performance
Author(s) -
Inomata Satoshi,
Tanimoto Hiroshi,
Aoki Nobuyuki,
Hirokawa Jun,
Sadanaga Yasuhiro
Publication year - 2006
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.2405
Subject(s) - chemistry , ion , hydronium , analytical chemistry (journal) , mass spectrometry , ion source , proton , ionization , reagent , chromatography , physics , organic chemistry , quantum mechanics
A novel ion source based on direct current (d.c.) discharge has been developed for proton transfer reaction ionization operated at relatively high ion drift tube pressure. The shape and geometry of the ion source are designed to maximize overall ion intensity and to minimize interference from sample air. The initial performance of the technique, including speciation and intensity of reagent ions, their stability, and the impact of artifact signals, is evaluated by means of a proton transfer reaction time‐of‐flight mass spectrometer (PTR‐TOFMS) newly built in our laboratory. Intensities of the hydronium (H 3 O + ) ions are typically (5–7) × 10 5 counts for a 1‐min integration time with a duty cycle of ∼1%. The fluctuations of the ion signals over a period of hours are within 4%. Although the formation of artifact ions from sample air (NO + and O 2 + ), which react with volatile organic compounds (VOCs) and subsequently cause fragmentation, is observed as background signals in addition to hydronium and mono‐ and di‐hydrate H 3 O + ions, intensities of both NO + and O 2 +ions are only ∼0.5% of those of H 3 O + ions. Using our PTR‐TOFMS system at a drift tube pressure of ∼5 Torr, the detection sensitivities are significantly improved and the detection limits for propene, acetaldehyde, acetone, isoprene, benzene, toluene, and p ‐xylene are estimated to be at the sub‐ppbv level for 1‐min integration. Copyright © 2006 John Wiley & Sons, Ltd.