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Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systems
Author(s) -
De Mondt Roel,
Van Vaeck Luc,
Lenaerts Jens,
Geuens Ingrid,
Van Luppen Jaymes
Publication year - 2006
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.2357
Subject(s) - chemistry , mass spectrometry , ion , adsorption , molecule , wafer , analytical chemistry (journal) , static secondary ion mass spectrometry , adduct , sputtering , secondary ion mass spectrometry , inorganic chemistry , chromatography , nanotechnology , organic chemistry , thin film , materials science
Abstract Chemical engineering of high‐technology products requires elucidation of intermolecular interactions in complex materials. As part of an extensive study on thermographic systems, static secondary ion mass spectrometry (S‐SIMS) was used to probe the physicochemical behaviour of active compounds, such as different tone modifiers and stabilisers, on silver. In particular, the feasibility of detecting adsorption and/or binding of individual additives and mixtures to silver was examined. Substrates prepared by sputter coating silver on silicon wafers were exposed to solutions of the studied compounds in 2‐butanone. The signal intensities measured with S‐SIMS for the ad‐layers showed reproducibility to within 10%. Radical ions containing silver such as [M–H+Ag] + . were used as evidence for the formation of bonds in the solid. Also the [M–H+2Ag] + ions could be assigned to chemisorbed species while [M+Ag] + ions could be formed by adduct ionisation of molecules with co‐ejected Ag + ions. The signal intensities of [M–H+Ag] + . and [M–H+2Ag] + ions were used to monitor the adsorption quantitatively as a function of time. Copyright © 2006 John Wiley & Sons, Ltd.