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Determination of artefact peaks in mass‐analysed ion kinetic energy spectra using a new linked scan for ebe geometry magnetic sector instruments
Author(s) -
Mouget Yves,
Bertrand Michel J.
Publication year - 1995
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290091317
Subject(s) - kinetic energy , chemistry , mass spectrum , ion , spectral line , energy (signal processing) , energy spectrum , spectrum (functional analysis) , magnet , analytical chemistry (journal) , geometry , atomic physics , physics , nuclear physics , mathematics , organic chemistry , chromatography , quantum mechanics , astronomy
Abstract The possible presence of artefact peaks in mass‐analyzed ion kinetic energy (MIKE) spectra has been recognized when such scans are performed using a two‐sector instrument of reverse (BE) configuration. Since the presence of an artefact peak can be misleading when interpreting a spectrum, a new scan is proposed which allows these artefacts to be identified. This scan involves linking and scanning the two electrostatic sectors of an E 1 BE 2 geometry instrument, while maintaining the magnet at the mass selected for the MIKE scan. This selected mass‐analyzed ion kinetic energy (SMIKE) scan at E 1 =E 2 results in a spectrum containing only artefact peaks that can be present in the corresponding MIKE spectrum.