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A tandem reflectron time‐of‐flight mass spectrometer for the investigation of laser photofragmentation of molecular ions
Author(s) -
Jia W. J.,
Ledingham K. W. D.,
Scott C. T. J.,
Kosmidis C.,
Singhal R. P.
Publication year - 1995
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290090908
Subject(s) - reflectron , chemistry , mass spectrometry , time of flight , ion , tandem mass spectrometry , fragmentation (computing) , time of flight mass spectrometry , analytical chemistry (journal) , ionization , chromatography , organic chemistry , computer science , operating system
A tandem reflectron time‐of‐flight mass spectrometer has been constructed for the investigation of laser photofragmentation of selected molecular ions. Ions are generated by an ablation laser and attracted by ion optics into the field‐free flight region of a reflectron time‐of‐flight mass spectrometer. Laser photofragmentation of selected molecular ions takes place at the turn‐around point of ions in the reflectron. Fragmentation mass calibration, parent ion selection, ion collection effects, reflectron field effects and the mass resolution of this tandem reflectron time‐of‐flight mass spectrometer are described. Furthermore it is shown that laser parameters may be used to control the fragmentation pattern.