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Graphical method for artefact peak interpretation, and methods for their rejection, using double and triple sector magnetic mass spectrometers
Author(s) -
Mouget Yves,
Bertrand Michel J.
Publication year - 1995
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290090506
Subject(s) - chemistry , kinetic energy , representation (politics) , cube (algebra) , interpretation (philosophy) , spectrum analyzer , computational physics , geometry , optics , computer science , physics , classical mechanics , mathematics , politics , political science , law , programming language
The problem of artefact peaks, in spectra obtained from various tandem mass spectrometric scans on instruments of both forward and reverse geometry, is examined. The filtering conditions imposed by additional analyzers are investigated, in order to evaluate the potential of several different triple sector geometries to reduce specific interferences. No previous evaluation of the rejection ability for artefacts of different origins has been presented with respect to the various geometries. In order to gain a better insight into the origin of various artefacts, and to more easily explain their occurrence in certain geometries, a new graphical representation was developed in order to take into account the effects of three analyzer fields. This approach allows different linked scans to be projected within a cube, while also qualitatively proposing an explanation for the presence or absence of artefact peaks. New scans can also be conceived by means of this method, as is the case with a new selected mass ion kinetic energy (SMIKE) scan, which allows artefacts present in MIKE scans performed using reverse geometry instruments to be determined.