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Dissociative attachment studies by negative‐ion time‐of‐flight mass spectrometry
Author(s) -
Krishnakumar E.,
Nagesha K.
Publication year - 1995
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290090415
Subject(s) - chemistry , mass spectrometry , time of flight , ion , time of flight mass spectrometry , ion mobility spectrometry–mass spectrometry , analytical chemistry (journal) , selected reaction monitoring , tandem mass spectrometry , chromatography , ionization , organic chemistry
Experiments using time‐of‐flight mass spectrometry for studying the formation of negative ions in dissociative attachment processes by electron impact are discussed. The problems of making accurate measurements of absolute partial cross‐sections have been solved using a combination of a new pulsed‐electron‐beam/pulsed‐ion‐extraction technique, the relative flow technique and a time‐of‐flight mass spectrometer. We also discuss some of the results obtained utilizing this method.