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Secondary ion emission from frozen argon by 252 Cf fission fragments
Author(s) -
Wien Karl,
Spieth Axel
Publication year - 1995
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290090309
Subject(s) - chemistry , sputtering , fission , ion , argon , atomic physics , van der waals force , cluster (spacecraft) , mass spectrum , yield (engineering) , spectral line , irradiation , analytical chemistry (journal) , thin film , nuclear physics , molecule , nanotechnology , physics , materials science , organic chemistry , chromatography , astronomy , computer science , neutron , thermodynamics , programming language
In order to study sputtering of Van‐der‐Waals solids by MeV ion impact, films of solid argon condensed onto a metallic substrate at a temperature of 10 K were irradiated by 252 Cf fission fragments. The secondary ions emitted from the surface were investigated by a time‐of‐flight technique. The mass spectra are dominated by a cluster series Ar n +with n ranging from 1 to about 30. Comparatively high absolute ion yields were determined; the yield of Ar + was 48 ions/impact. The mass line of Ar + was broadened due to ejection energies of up to 50 eV. The line shape of the cluster ions indicates delayed particle emission. Some of the observed phenomena are not typical for electronic sputtering at MeV energies; they are briefly discussed. These are the first and preliminary results of a systematic exploration of high energy sputtering from solid rare gases.