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Secondary‐ion mass spectrometry methodology and surface chemistry of mixed oxide electrodes: Modifications induced by noble‐metal content
Author(s) -
Daolio Sergio,
Facchin Bruno,
Pagura Cesare,
De Battisti Achille,
Barbieri Andrea
Publication year - 1994
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290080817
Subject(s) - chemistry , oxide , secondary ion mass spectrometry , mass spectrometry , noble metal , ion , inorganic chemistry , electrochemistry , metal , ionic bonding , catalysis , electrode , organic chemistry , chromatography
Mixed‐oxide coatings are extensively used in the electrochemical industry. Secondary‐ion mass spectrometric data confirm that technological research can indeed find a new way of controlling precursors, synthesis conditions, purity of coatings and electrodic activity. Results obtained by argon and oxygen primary‐ion bombardment of RuO 2 /TiO 2 , IrO 2 /TiO 2 , RuO 2 /IrO 2 /TiO 2 films are reported. The presence of metal, metal oxide and cluster ions suggests a more systematic use of secondary‐ion mass spectrometry in the elucidation of catalytic aspects. In‐depth profiles of some ionic species and their correlation with parameters that induce significant modifications can help in the understanding of the solid state physics and inorganic chemistry involved.