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Double‐electron transfer from Xe to Xe 4+ at low energies as observed in the trap of a fourier‐transform ion cyclotron resonance mass spectrometer
Author(s) -
von Köding Holger,
Pinkse Frans A.,
Nibbering Nico M. M.
Publication year - 1993
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290070819
Subject(s) - xenon , fourier transform ion cyclotron resonance , chemistry , ion , ion cyclotron resonance , atomic physics , mass spectrometry , ion trap , penning trap , resonance (particle physics) , analytical chemistry (journal) , cyclotron , physics , organic chemistry , chromatography
Multiply charged Xe n + ions with n ⩽5 were generated by electron impact on xenon gas in the external ion source of a Fourier‐transform ion cyclotron resonance (FT‐ICR) mass spectrometer. These ions were transferred to and trapped in the low pressure FT‐ICR cell. Subsequently, xenon ions with a particular mass and charge state were selected by ejection of all other unwanted ions from the FT‐ICR cell and allowed to react with neutral xenon atoms. It was found that, in the interactions between Xe 4+ ions and neutral xenon atoms, not only does a single electron transfer take place, but also a double electron transfer.