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Enhanced efficiency of surface‐induced dissociation of slow molecular ions at grazing incidence
Author(s) -
Schmidt Lothar,
Fritsch HansWalter,
Jungcfas Hartmut
Publication year - 1993
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290070621
Subject(s) - ion , chemistry , dissociation (chemistry) , kinetic energy , mass spectrometry , sputtering , atomic physics , secondary electrons , desorption , yield (engineering) , electron ionization , analytical chemistry (journal) , electron , ionization , thin film , physics , chromatography , nuclear physics , adsorption , organic chemistry , quantum mechanics , thermodynamics
Ions of m / z > 10 4 colliding with a solid surface at kinetic energies of 10–30 keV induce sputtering of secondary ions rather than emission of secondary electrons. Impact energies of 1 keV or lower lead to surface‐induced dissociation (SID) resulting in the release of specific fragment ions and this could also be employed for the detection of large ions in mass spectrometry. The present study using plasma‐desorption time‐of‐flight mass spectrometry gives evidence that the secondary ion yield of tlte SID‐process is maximal at grazing incidence. For impact energies ranging from 0,66 to 1.4 keV the SID efficiency is nearly constant and can be higher for large than for small organic ions colliding with a flat surface at grazing incidence angles.