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Thermal surface ionization of quaternary ammonium salts in particle‐beam mass spectrometry
Author(s) -
van der Hoeven R. A. M.,
Tinke A. P.,
Niessen W. M. A.,
van der Greef J.
Publication year - 1993
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290070109
Subject(s) - chemistry , thermal ionization , thermal ionization mass spectrometry , mass spectrometry , ionization , chemical ionization , electron ionization , fragmentation (computing) , direct electron ionization liquid chromatography–mass spectrometry interface , analytical chemistry (journal) , particle beam , beam (structure) , chromatography , ion , organic chemistry , optics , physics , computer science , operating system
The applicability of thermal surface ionization in liquid chromatography/particle‐beam mass spectrometry is investigated for the analysis of quaternary ammonium compounds. The compounds are mass anlyzed in a filament‐off mode of operation with a particle‐beam interface. An intense signal of the molecular cations is observed, while fragmentation can be induced by gas collisions and characterized using tandem mass spectrometry. A significant gain in signal‐to‐noise ratio in thermal surface ionization relative to electron ionization is observed.