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The realization of a low‐energy ion‐scattering technique with an ion cyclotron resonance spectrometer
Author(s) -
Nikolaev E. N.,
Mordehai A. V.,
Frankevich V. E.
Publication year - 1991
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290050603
Subject(s) - chemistry , mass spectrometry , ion cyclotron resonance , ion , secondary ion mass spectrometry , spectrometer , selected ion monitoring , fourier transform ion cyclotron resonance , hybrid mass spectrometer , cyclotron resonance , static secondary ion mass spectrometry , resonance (particle physics) , scattering , cyclotron , atomic physics , analytical chemistry (journal) , selected reaction monitoring , optics , tandem mass spectrometry , physics , chromatography , gas chromatography–mass spectrometry , organic chemistry
A low energy ion scattering technique for investigation of the first monolayer of a surface has been realized in an ion cyclotron resonance mass spectrometer. The secondary‐ion mass spectrometry mode is also available in the same configuration. Preliminary results are shown for the analysis of the metal surface of a magneto‐optical recording film.