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Sputter yields of ammonium chloride and solid glycerol
Author(s) -
Gillen Greg,
Christiansen J. W.,
Tsong I. S. T.,
Kimball B.,
Williams Peter,
Cooks R. Graham
Publication year - 1988
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/rcm.1290020404
Subject(s) - chemistry , sputtering , ammonium chloride , ammonium , glycerol , yield (engineering) , ion , chloride , mass spectrometry , molecule , inorganic chemistry , analytical chemistry (journal) , nuclear chemistry , chromatography , thin film , organic chemistry , nanotechnology , metallurgy , materials science
We have measured the sputtering yields of ammonium chloride and of frozen glycerol films under 8 keV Ar +˙ bombardment using a thin film depth profiling technique. The sputtering yield of ammonium chloride was 34±3 molecules (NH 4 Cl)/ion; for frozen glycerol the sputter yield was 54±9 molecules/ion. The results constrain possible mechanisms of damage suppression in organic secondary ion mass spectrometry.