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Front Cover: Memristive Devices for Quantum Metrology (Adv. Quantum Technol. 5/2020)
Author(s) -
Milano Gianluca,
Ferrarese Lupi Federico,
Fretto Matteo,
Ricciardi Carlo,
De Leo Natascia,
Boarino Luca
Publication year - 2020
Publication title -
advanced quantum technologies
Language(s) - English
Resource type - Reports
ISSN - 2511-9044
DOI - 10.1002/qute.202070051
Subject(s) - metrology , realization (probability) , traceability , quantum , front cover , nanotechnology , cover (algebra) , physics , optoelectronics , computer science , materials science , engineering , optics , quantum mechanics , mathematics , mechanical engineering , statistics , software engineering
In the light of the revision of the International System of Units (SI), in article number 29 Gianluca Milano and co‐workers discuss on the possibility of using memristive devices for quantum metrology. Exhibiting quantized conductance phenomena in air at room temperature, memristive devices can be exploited for the realization of a resistance standard implementable on‐chip for self‐calibrating systems with zero‐chain traceability.