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Extreme sensitivity of corrugation strength on diffraction resonance line‐shapes for the gas–surface system He (21 meV)/Cu (115)
Author(s) -
Engdahl Erik
Publication year - 1992
Publication title -
international journal of quantum chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.484
H-Index - 105
eISSN - 1097-461X
pISSN - 0020-7608
DOI - 10.1002/qua.560440858
Subject(s) - diffraction , resonance (particle physics) , line (geometry) , surface (topology) , signature (topology) , sensitivity (control systems) , materials science , chemistry , nuclear magnetic resonance , atomic physics , molecular physics , optics , physics , geometry , mathematics , electronic engineering , engineering
An example of an isolated resonance with highly non‐Lorentzian line‐shape has been found for the gas–surface diffraction system He(21 meV)/Cu(115 ). When the corrugation strength parameter for the surface is very slightly varied, the signature of the narrow resonance structure shifts. © 1992 John Wiley & Sons, Inc.