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Interface science in nanoparticles: An electronic structure view of photon‐in/photon‐out soft‐X‐ray spectroscopy
Author(s) -
Guo Jinghua
Publication year - 2009
Publication title -
international journal of quantum chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.484
H-Index - 105
eISSN - 1097-461X
pISSN - 0020-7608
DOI - 10.1002/qua.22174
Subject(s) - nanomaterials , photon , spectroscopy , nanoparticle , nanotechnology , valence (chemistry) , electronic structure , materials science , chemical species , chemistry , chemical physics , physics , optics , quantum mechanics , computational chemistry , organic chemistry
The ability to control the particle size and morphology of nanoparticles is of crucial importance nowadays both from a fundamental and industrial point of view considering nanostructured 3d metal compounds in the applications of solar photovoltaic, sunlight water splitting and photoelectrochemical cells, chemical and biosensors, etc. In the soft X‐ray region, the question tends to be, what are the electrons doing as they migrated between the atoms? Soft‐X‐ray absorption and emission spectroscopy have basic features that are important to interface science. X‐ray is originating from an electronic transition between a localized core state and a valence state that makes this probe localized to one specific atomic site and gives the method chemical state sensitivity and further, particular symmetry information. The possibility to select the energy of the excitation has created an extra degree of freedom and opens a new field of study by disclosing many new possibilities of soft‐X‐ray resonant inelastic scattering. In this presentation, recent findings regarding X‐ray spectroscopic studies of various nanomaterials are presented. Also, in situ characterization of nanocrystal suspensions demonstrated the way for real‐time studies of nanomaterial growth and chemical reactions. © 2009 Wiley Periodicals, Inc. Int J Quantum Chem, 2009