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Bayesian monitoring to detect a shift in process mean
Author(s) -
Marcellus Richard L.
Publication year - 2008
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.895
Subject(s) - bayesian probability , chart , control chart , computer science , bar chart , statistics , process (computing) , \bar x and r chart , data mining , mathematics , artificial intelligence , control limits , operating system
A Bayesian analogue of the Shewhart X‐bar chart is defined and compared with cumulative sum charts. The comparison identifies types of production process where the Bayesian chart has better expected performance than the cumulative sum chart. Implementing the Bayesian chart requires more detailed knowledge of the process structure than is required by the best‐known types of charts, but acquiring this information can yield tangible benefits. Copyright © 2007 John Wiley & Sons, Ltd.