z-logo
Premium
A study of the modeling and analysis of software fault‐detection and fault‐correction processes
Author(s) -
Xie M.,
Hu Q. P.,
Wu Y. P.,
Ng S. H.
Publication year - 2007
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.827
Subject(s) - fault detection and isolation , reliability engineering , fault (geology) , software fault tolerance , software quality , software , computer science , fault model , fault coverage , reliability (semiconductor) , set (abstract data type) , process (computing) , stuck at fault , data mining , software development , engineering , artificial intelligence , programming language , electronic circuit , power (physics) , physics , actuator , geology , electrical engineering , quantum mechanics , seismology
Most of the models for software reliability analysis are based on reliability growth models which deal with the fault detection process. This is done either by assuming that faults are corrected immediately after being detected or the time to correct a fault is not counted. Some models have been developed to relax this assumption. However, unlike the fault‐detection process, few published data sets are available to support the modeling and analysis of both the fault detection and removal processes. In this paper, some useful approaches to the modeling of both software fault‐detection and fault‐correction processes are discussed. Further analysis on the software release time decision that incorporates both a fault‐detection model and fault‐correction model is also presented. This procedure is easy to use and useful for practical applications. The approach is illustrated with an actual set of data from a software development project. Copyright © 2006 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here