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Note on ‘Construction of Double Sampling s‐Control Charts for Agile Manufacturing’
Author(s) -
Hsu LieFern
Publication year - 2007
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.776
Subject(s) - control chart , sampling (signal processing) , reliability (semiconductor) , control (management) , statistical process control , chart , agile software development , shewhart individuals control chart , quality (philosophy) , sample size determination , statistics , engineering , computer science , reliability engineering , industrial engineering , process (computing) , operations research , mathematics , ewma chart , artificial intelligence , telecommunications , physics , philosophy , software engineering , quantum mechanics , epistemology , operating system , detector , power (physics)
He and Grigoryan ( Quality and Reliability Engineering International 2002; 18 :343–355) formulated the design of a double‐sampling (DS) s control chart as an optimization problem and solved it with a genetic algorithm. They concluded that the DS s control charts can be a more economically preferable alternative in detecting small shifts than traditional s control charts. We explain that, since they only considered the average sample size when the process is in control, their conclusion is questionable. Copyright © 2006 John Wiley & Sons, Ltd.