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Monitoring Infrequent Failures of High‐volume Production Processes
Author(s) -
Di Bucchianico A.,
Mooiweer G. D.,
Moonen E. J. G.
Publication year - 2005
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.738
Subject(s) - yield (engineering) , volume (thermodynamics) , production (economics) , process (computing) , reliability engineering , computer science , statistics , mathematics , engineering , economics , materials science , physics , quantum mechanics , metallurgy , macroeconomics , operating system
We present a case study in monitoring a high‐volume production process with a high yield. Testing the products is difficult and is only possible in a destructive way with a defect/no‐defect result. We review several attribute charting procedures for high‐yield processes. It turns out that monitoring the number of conforming items between the occurrence of non‐conforming items is appropriate. We discuss several implementation aspects of CCC r charts in our case study. The implementation is based on a new formula for the standard deviation of the number of inspected items before a signal. Copyright © 2005 John Wiley & Sons, Ltd.