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A Large‐sample Confidence Band for a Multi‐response Ridge Path
Author(s) -
Ding Rui,
Lin Dennis K. J.,
Peterson John J.
Publication year - 2005
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.707
Subject(s) - ridge , path (computing) , confidence interval , sample (material) , path analysis (statistics) , computer science , statistics , geology , mathematics , physics , paleontology , thermodynamics , programming language
Ridge analysis in response surface methodology has received extensive discussion in the literature, while little is known for ridge analysis in the multi‐response case. In this paper, the ridge path is investigated for multi‐response surfaces and a large‐sample simultaneous confidence interval (confidence band) for the ridge path is developed. Copyright © 2005 John Wiley & Sons, Ltd.