Another Look at the Process Capability Index | Zendy

Chao MinTe | Zendy; Lin Dennis K. J. | Zendy

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Another Look at the Process Capability Index

Author(s) -

Chao MinTe,

Lin Dennis K. J.

Publication year - 2006

Publication title -

quality and reliability engineering international

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.913

H-Index - 62

eISSN - 1099-1638

pISSN - 0748-8017

DOI - 10.1002/qre.692

Subject(s) - process capability index , conventional pci , process capability , process (computing) , index (typography) , value (mathematics) , reliability engineering , yield (engineering) , computer science , engineering , manufacturing engineering , mathematics , statistics , work in process , operations management , medicine , materials science , psychiatry , myocardial infarction , world wide web , metallurgy , operating system

Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, C y , is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples. Copyright © 2005 John Wiley & Sons, Ltd.

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