Another Look at the Process Capability Index
Author(s) -
Chao MinTe,
Lin Dennis K. J.
Publication year - 2006
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.692
Subject(s) - process capability index , conventional pci , process capability , process (computing) , index (typography) , value (mathematics) , reliability engineering , yield (engineering) , computer science , engineering , manufacturing engineering , mathematics , statistics , work in process , operations management , medicine , materials science , psychiatry , myocardial infarction , world wide web , metallurgy , operating system
Abstract Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, C y , is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples. Copyright © 2005 John Wiley & Sons, Ltd.