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Statistical Models and Control Charts for High‐Quality Processes , M. Xie, T. N. Goh and V. Kuralmani, pages
Author(s) -
Pan Rong
Publication year - 2004
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.556
Subject(s) - citation , quality (philosophy) , computer science , reliability (semiconductor) , library science , information retrieval , mathematics , philosophy , physics , thermodynamics , epistemology , power (physics)
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