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Setting reliability requirements based on minimum failure‐free operating periods
Author(s) -
Todinov M. T.
Publication year - 2004
Publication title -
quality and reliability engineering international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.913
H-Index - 62
eISSN - 1099-1638
pISSN - 0748-8017
DOI - 10.1002/qre.529
Subject(s) - reliability engineering , reliability (semiconductor) , mean time between failures , failure rate , hazard , computer science , engineering , power (physics) , chemistry , physics , organic chemistry , quantum mechanics
A new reliability methodology and tools have been created for setting reliability requirements. At the heart of the new methodology are reliability requirements based on specified minimum failure‐free operating (MFFOP) intervals and a maximum acceptable level of the probability of premature failure. These types of requirements are suitable to industries where the consequences of failure and the cost of intervention for maintenance are very high (e.g. deepwater offshore oil and gas industries). The methodology proposed includes models and tools for: (i) setting reliability requirements to limit the risk of premature failure below an acceptable level; (ii) setting reliability requirements to minimize the total losses; and (iii) setting reliability requirements to guarantee a set of MFFOP intervals. An advantage of the MFFOP approach is that it directly links the reliability requirements with health, safety, environmental and business risks. Another advantage is that the MFFOP requirements are suitable for non‐constant hazard rates where the mean time to failure (MTTF) reliability measure is often misleading. A solution to the important problem of determining the maximum hazard rate that guarantees with a required probability the existence of a specified set of MFFOP intervals has also been found. The reliability tools proposed also permit the extraction of useful information from data sets containing a given number of random failures, in cases where the failure times are unknown. Copyright © 2003 John Wiley & Sons, Ltd.